Solid State Science and Technology, Vol. 15, No 1 (2007) 95-101

ISSN 0128-7389

Corresponding Author:



Lim Qiao Jiea, Samsudi Sakrania and Yussof Wahabb

aIbnu Sina Institute for Fundamental Science Studies, 81310 UTM Skudai Johor

bPhysics Department, Faculty of Science, 81310 UTM Skudai Johor, Malaysia



An approach for the calculation of thin film nucleation rate, J is highlighted in this

paper. Nucleation is a random process in which the number of nuclei formed in a fixed

interval of time is a random quantity and subjected to statistical laws. This normally

applies to either the frequency of appearance at time, t of nuclei per unit volume or area

of the system under consideration, based on the classical kinetic theory of nucleation. In

this work, the nucleation rates, J was calculated using a visual basic programming by

identifying appropriate parameters from the pre-exponential factor, contact angle,

desorption energy, diffusion energy, supersaturation ratio, etc.) and performing trial and

error execution. It was observed that, from the different plots of nucleation rates, J for

vapour/liquid and liquid/solid transition was found to lie within the reasonable

experimental ranges.



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