Solid State Science and Technology, Vol. 20, No 1 & 2 (2012) 56-61

 

ISSN 0128-7389

56

STUDY ON STRUCTURE, MICROSTRUCTURE AND ELECTRICAL

PROPERTIES OF La0.67Ca0.33MnO3 SYSTEM IN BULK AND THIN FILM

 

K. P. Lim, S. A. Halim, S. K. Chen, S. W. Ng, J. K. Wong,

H. M. Albert Gan and H. S. Woon

Department of Physics, Faculty of Science, Universiti Putra Malaysia,

43400 UPM Serdang, Selangor, Malaysia.

 

ABSTRACT

Manganite compound of La0.67Ca0.33MnO3 polycrystalline in bulk and thin film have

been prepared by solid state reaction and pulsed laser ablation deposition method

(PLAD), respectively. Rietveld’s refinement showed both samples in single phase of

orthorhombic structure with space group of Pbnm. Bulk and thin film showed much

different microstructure, where bulk have relatively much more larger crystalline size

(~1-2 μm) as compare to thin film (~40-60 nm) samples. Bulk sample showed typical

insulator-to-metal transition (Tp) at 218 K when H=0T and shift to 224 K in H=1T.

However, thin film sample shows almost insulating over the entire range of temperature

and no Tp is observed at the entire measurement range. In this work, we observed that

microstructure formation change when convert from bulk to film and drastically charge

it electrical resistance.

Keywords: polycrystalline; perovskite manganite; thin film; magnetoresistance

 

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