Solid State Science and Technology, Vol. 20, No 1 & 2 (2012) 56-61
STUDY ON STRUCTURE, MICROSTRUCTURE AND ELECTRICAL
PROPERTIES OF La0.67Ca0.33MnO3 SYSTEM IN BULK AND THIN FILM
K. P. Lim, S. A. Halim, S. K. Chen, S. W. Ng, J. K. Wong,
H. M. Albert Gan and H. S. Woon
Department of Physics, Faculty of Science, Universiti Putra Malaysia,
43400 UPM Serdang, Selangor, Malaysia.
Manganite compound of La0.67Ca0.33MnO3 polycrystalline in bulk and thin film have
been prepared by solid state reaction and pulsed laser ablation deposition method
(PLAD), respectively. Rietveld’s refinement showed both samples in single phase of
orthorhombic structure with space group of Pbnm. Bulk and thin film showed much
different microstructure, where bulk have relatively much more larger crystalline size
(~1-2 μm) as compare to thin film (~40-60 nm) samples. Bulk sample showed typical
insulator-to-metal transition (Tp) at 218 K when H=0T and shift to 224 K in H=1T.
However, thin film sample shows almost insulating over the entire range of temperature
and no Tp is observed at the entire measurement range. In this work, we observed that
microstructure formation change when convert from bulk to film and drastically charge
it electrical resistance.
Keywords: polycrystalline; perovskite manganite; thin film; magnetoresistance
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